MIT Subject Listing & Schedule
IAP / Spring 2018 Search Results

Searched for: "2.131"    Subjects offered any term

1 subject found.

2.131 Advanced Instrumentation and Measurement

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Prereq: Permission of Instructor
Units: 3-6-3
Four additional lab hours TBA. Lecture: TR9.30-11 (3-370) Lab: TR11 (3-147)

Provides training in advanced instrumentation and measurement techniques. Topics include system level design, fabrication and evaluation with emphasis on systems involving concepts and technology from mechanics, optics, electronics, chemistry and biology. Simulation, modeling and design software. Use of a wide range of instruments/techniques (e.g., scanning electron microscope, dynamic signal/system analyzer, impedance analyzer, laser interferometer) and fabrication/machining methods (e.g., laser micro-machining, stereo lithography, computer controlled turning and machining centers). Theory and practice of both linear and nonlinear system identification techniques. Lab sessions include instruction and group project work. No final exam.
I. Hunter
No textbook information available