PATENTS   
Patents > Tools and Guidance >> Classification >>> Class Schedule
    Class Numbers & Titles   | Class Numbers Only   | USPC Index   | International   | HELP  
You are viewing a USPC Schedule.
[Search a list of Patent Appplications for class 702]  Class   702DATA PROCESSING: MEASURING, CALIBRATING, OR TESTING
Click here for a printable version of this file
[List of Patents for class 702 subclass 1]  1           MEASUREMENT SYSTEM IN A SPECIFIC ENVIRONMENT
[List of Patents for class 702 subclass 2]  2           Subclass 2 indent level is 1 Earth science
[List of Patents for class 702 subclass 3]  3           Subclass 3 indent level is 2 Weather
[List of Patents for class 702 subclass 4]  4           Subclass 4 indent level is 3 Lightning
[List of Patents for class 702 subclass 5]  5           Subclass 5 indent level is 2 Topography (e.g., land mapping)
[List of Patents for class 702 subclass 6]  6           Subclass 6 indent level is 2 Well logging or borehole study
[List of Patents for class 702 subclass 7]  7           Subclass 7 indent level is 3 By induction or resistivity logging tool
[List of Patents for class 702 subclass 8]  8           Subclass 8 indent level is 3 By radiation (e.g., nuclear, gamma, X-ray)
[List of Patents for class 702 subclass 9]  9           Subclass 9 indent level is 3 Drilling
[List of Patents for class 702 subclass 10]  10           Subclass 10 indent level is 3 Dipmeter
[List of Patents for class 702 subclass 11]  11           Subclass 11 indent level is 3 Formation characteristic
[List of Patents for class 702 subclass 12]  12           Subclass 12 indent level is 4 Fluid flow investigation
[List of Patents for class 702 subclass 13]  13           Subclass 13 indent level is 5 Hydrocarbon prospecting
[List of Patents for class 702 subclass 14]  14           Subclass 14 indent level is 2 Seismology
[List of Patents for class 702 subclass 15]  15           Subclass 15 indent level is 3 Earthquake or volcanic activity
[List of Patents for class 702 subclass 16]  16           Subclass 16 indent level is 3 Specific display system (e.g., mapping, profiling)
[List of Patents for class 702 subclass 17]  17           Subclass 17 indent level is 3 Filtering or noise reduction/removal
[List of Patents for class 702 subclass 18]  18           Subclass 18 indent level is 3 Velocity of seismic wave
[List of Patents for class 702 subclass 19]  19           Subclass 19 indent level is 1 Biological or biochemical
[List of Patents for class 702 subclass 20]  20           Subclass 20 indent level is 2 Gene sequence determination
[List of Patents for class 702 subclass 21]  21           Subclass 21 indent level is 2 Cell count or shape or size analysis (e.g., blood cell)
[List of Patents for class 702 subclass 22]  22           Subclass 22 indent level is 1 Chemical analysis
[List of Patents for class 702 subclass 23]  23           Subclass 23 indent level is 2 Quantitative determination (e.g., mass, concentration, density)
[List of Patents for class 702 subclass 24]  24           Subclass 24 indent level is 3 Gaseous mixture (e.g., solid-gas, liquid-gas, gas-gas)
[List of Patents for class 702 subclass 25]  25           Subclass 25 indent level is 3 Liquid mixture (e.g., solid-liquid, liquid-liquid)
[List of Patents for class 702 subclass 26]  26           Subclass 26 indent level is 3 By particle count
[List of Patents for class 702 subclass 27]  27           Subclass 27 indent level is 2 Molecular structure or composition determination
[List of Patents for class 702 subclass 28]  28           Subclass 28 indent level is 3 Using radiant energy
[List of Patents for class 702 subclass 29]  29           Subclass 29 indent level is 2 Particle size determination
[List of Patents for class 702 subclass 30]  30           Subclass 30 indent level is 2 Chemical property analysis
[List of Patents for class 702 subclass 31]  31           Subclass 31 indent level is 2 Specific operation control system
[List of Patents for class 702 subclass 32]  32           Subclass 32 indent level is 2 Specific signal data processing
[List of Patents for class 702 subclass 33]  33           Subclass 33 indent level is 1 Mechanical measurement system
[List of Patents for class 702 subclass 34]  34           Subclass 34 indent level is 2 Wear or deterioration evaluation
[List of Patents for class 702 subclass 35]  35           Subclass 35 indent level is 2 Flaw or defect detection
[List of Patents for class 702 subclass 36]  36           Subclass 36 indent level is 3 Location
[List of Patents for class 702 subclass 38]  38           Subclass 38 indent level is 3 Electromagnetic (e.g., eddy current)
[List of Patents for class 702 subclass 39]  39           Subclass 39 indent level is 3 Sound energy (e.g., ultrasonic)
[List of Patents for class 702 subclass 40]  40           Subclass 40 indent level is 3 Radiant energy (e.g., X-ray, infrared, laser)
[List of Patents for class 702 subclass 41]  41           Subclass 41 indent level is 2 Force or torque measurement
[List of Patents for class 702 subclass 42]  42           Subclass 42 indent level is 3 Stress or strain measurement
[List of Patents for class 702 subclass 43]  43           Subclass 43 indent level is 4 Torsional, shear, tensile, or compression
[List of Patents for class 702 subclass 44]  44           Subclass 44 indent level is 3 Mechanical work or power measurement
[List of Patents for class 702 subclass 45]  45           Subclass 45 indent level is 2 Flow metering
[List of Patents for class 702 subclass 46]  46           Subclass 46 indent level is 3 Count or pulse
[List of Patents for class 702 subclass 47]  47           Subclass 47 indent level is 3 Pressure, resistive, or capacitive sensor
[List of Patents for class 702 subclass 48]  48           Subclass 48 indent level is 3 Acoustic
[List of Patents for class 702 subclass 49]  49           Subclass 49 indent level is 3 Radiant energy
[List of Patents for class 702 subclass 50]  50           Subclass 50 indent level is 2 Fluid measurement (e.g., mass, pressure, viscosity)
[List of Patents for class 702 subclass 51]  51           Subclass 51 indent level is 3 Leak detecting
[List of Patents for class 702 subclass 52]  52           Subclass 52 indent level is 3 Capacitive sensor
[List of Patents for class 702 subclass 53]  53           Subclass 53 indent level is 3 Resistive sensor
[List of Patents for class 702 subclass 54]  54           Subclass 54 indent level is 3 Acoustic or vibration sensor
[List of Patents for class 702 subclass 55]  55           Subclass 55 indent level is 3 Liquid level or volume determination
[List of Patents for class 702 subclass 56]  56           Subclass 56 indent level is 2 Vibration detection
[List of Patents for class 702 subclass 57]  57           Subclass 57 indent level is 1 Electrical signal parameter measurement system
[List of Patents for class 702 subclass 58]  58           Subclass 58 indent level is 2 For electrical fault detection
[List of Patents for class 702 subclass 59]  59           Subclass 59 indent level is 3 Fault location
[List of Patents for class 702 subclass 60]  60           Subclass 60 indent level is 2 Power parameter
[List of Patents for class 702 subclass 61]  61           Subclass 61 indent level is 3 Power logging (e.g., metering)
[List of Patents for class 702 subclass 62]  62           Subclass 62 indent level is 4 Including communication means
[List of Patents for class 702 subclass 63]  63           Subclass 63 indent level is 3 Battery monitoring
[List of Patents for class 702 subclass 64]  64           Subclass 64 indent level is 2 Voltage or current
[List of Patents for class 702 subclass 65]  65           Subclass 65 indent level is 3 Including related electrical parameter
[List of Patents for class 702 subclass 66]  66           Subclass 66 indent level is 2 Waveform analysis
[List of Patents for class 702 subclass 67]  67           Subclass 67 indent level is 3 Display of waveform
[List of Patents for class 702 subclass 68]  68           Subclass 68 indent level is 4 Having specified user interface (e.g., marker, menu)
[List of Patents for class 702 subclass 69]  69           Subclass 69 indent level is 3 Signal quality (e.g., timing jitter, distortion, signal-to-noise ratio)
[List of Patents for class 702 subclass 70]  70           Subclass 70 indent level is 3 Waveform extraction
[List of Patents for class 702 subclass 71]  71           Subclass 71 indent level is 3 Waveform-to-waveform comparison
[List of Patents for class 702 subclass 72]  72           Subclass 72 indent level is 4 Phase comparison
[List of Patents for class 702 subclass 73]  73           Subclass 73 indent level is 4 Identification of waveform
[List of Patents for class 702 subclass 74]  74           Subclass 74 indent level is 4 Signal-in-signal determination
[List of Patents for class 702 subclass 75]  75           Subclass 75 indent level is 3 Frequency
[List of Patents for class 702 subclass 76]  76           Subclass 76 indent level is 4 Frequency spectrum
[List of Patents for class 702 subclass 77]  77           Subclass 77 indent level is 5 Using Fourier method
[List of Patents for class 702 subclass 78]  78           Subclass 78 indent level is 4 By count (e.g., pulse)
[List of Patents for class 702 subclass 79]  79           Subclass 79 indent level is 2 Time-related parameter (e.g., pulse-width, period, delay, etc.)
[List of Patents for class 702 subclass 80]  80           Subclass 80 indent level is 2 Specified memory location generation for storage
[List of Patents for class 702 subclass 81]  81           Subclass 81 indent level is 1 Quality evaluation
[List of Patents for class 702 subclass 82]  82           Subclass 82 indent level is 2 Having judging means (e.g., accept/reject)
[List of Patents for class 702 subclass 83]  83           Subclass 83 indent level is 2 Sampling Inspection Plan
[List of Patents for class 702 subclass 84]  84           Subclass 84 indent level is 2 Quality control
[List of Patents for class 702 subclass 85]  85           CALIBRATION OR CORRECTION SYSTEM
[List of Patents for class 702 subclass 86]  86           Subclass 86 indent level is 1 Linearization of measurement
[List of Patents for class 702 subclass 87]  87           Subclass 87 indent level is 1 Zeroing (e.g., null)
[List of Patents for class 702 subclass 88]  88           Subclass 88 indent level is 1 Zero-full scaling
[List of Patents for class 702 subclass 89]  89           Subclass 89 indent level is 1 Timing (e.g., delay, synchronization)
[List of Patents for class 702 subclass 90]  90           Subclass 90 indent level is 1 Error due to component compatibility
[List of Patents for class 702 subclass 91]  91           Subclass 91 indent level is 2 Having interchangeable sensors or probes
[List of Patents for class 702 subclass 92]  92           Subclass 92 indent level is 1 Direction (e.g., compass)
[List of Patents for class 702 subclass 93]  93           Subclass 93 indent level is 2 By another sensor
[List of Patents for class 702 subclass 94]  94           Subclass 94 indent level is 1 Position measurement
[List of Patents for class 702 subclass 95]  95           Subclass 95 indent level is 2 Coordinate positioning
[List of Patents for class 702 subclass 96]  96           Subclass 96 indent level is 1 Speed
[List of Patents for class 702 subclass 97]  97           Subclass 97 indent level is 1 Length, distance, or thickness
[List of Patents for class 702 subclass 98]  98           Subclass 98 indent level is 1 Pressure
[List of Patents for class 702 subclass 99]  99           Subclass 99 indent level is 1 Temperature
[List of Patents for class 702 subclass 100]  100           Subclass 100 indent level is 1 Fluid or fluid flow measurement
[List of Patents for class 702 subclass 101]  101           Subclass 101 indent level is 1 Weight
[List of Patents for class 702 subclass 102]  102           Subclass 102 indent level is 2 Tare weight adjusted
[List of Patents for class 702 subclass 103]  103           Subclass 103 indent level is 1 Acoustic
[List of Patents for class 702 subclass 104]  104           Subclass 104 indent level is 1 Sensor or transducer
[List of Patents for class 702 subclass 105]  105           Subclass 105 indent level is 1 For mechanical system
[List of Patents for class 702 subclass 106]  106           Subclass 106 indent level is 1 Signal frequency or phase correction
[List of Patents for class 702 subclass 107]  107           Subclass 107 indent level is 1 Circuit tuning (e.g., potentiometer, amplifier)
[List of Patents for class 702 subclass 108]  108           TESTING SYSTEM
[List of Patents for class 702 subclass 109]  109           Subclass 109 indent level is 1 For transfer function determination
[List of Patents for class 702 subclass 110]  110           Subclass 110 indent level is 2 Binary signal stimulus (e.g., pulse)
[List of Patents for class 702 subclass 111]  111           Subclass 111 indent level is 2 Noise signal stimulus (e.g., white noise)
[List of Patents for class 702 subclass 112]  112           Subclass 112 indent level is 2 Sinusoidal signal stimulus
[List of Patents for class 702 subclass 113]  113           Subclass 113 indent level is 1 Of mechanical system
[List of Patents for class 702 subclass 114]  114           Subclass 114 indent level is 2 Pneumatic or hydraulic system
[List of Patents for class 702 subclass 115]  115           Subclass 115 indent level is 2 Electromechanical or magnetic system
[List of Patents for class 702 subclass 116]  116           Subclass 116 indent level is 1 Of sensing device
[List of Patents for class 702 subclass 117]  117           Subclass 117 indent level is 1 Of circuit
[List of Patents for class 702 subclass 118]  118           Subclass 118 indent level is 2 Testing multiple circuits
[List of Patents for class 702 subclass 119]  119           Subclass 119 indent level is 2 Including program initialization (e.g., program loading) or code selection (e.g., program creation)
[List of Patents for class 702 subclass 120]  120           Subclass 120 indent level is 2 Including input/output or test mode selection means
[List of Patents for class 702 subclass 121]  121           Subclass 121 indent level is 1 Including multiple test instruments
[List of Patents for class 702 subclass 122]  122           Subclass 122 indent level is 1 Including specific communication means
[List of Patents for class 702 subclass 123]  123           Subclass 123 indent level is 1 Including program set up
[List of Patents for class 702 subclass 124]  124           Subclass 124 indent level is 1 Signal generation or waveform shaping
[List of Patents for class 702 subclass 125]  125           Subclass 125 indent level is 2 Timing signal
[List of Patents for class 702 subclass 126]  126           Subclass 126 indent level is 2 Signal conversion
[List of Patents for class 702 subclass 127]  127           MEASUREMENT SYSTEM
[List of Patents for class 702 subclass 128]  128           Subclass 128 indent level is 1 Article count or size distribution
[List of Patents for class 702 subclass 129]  129           Subclass 129 indent level is 2 Quantitative determination by weight
[List of Patents for class 702 subclass 130]  130           Subclass 130 indent level is 1 Temperature measuring system
[List of Patents for class 702 subclass 131]  131           Subclass 131 indent level is 2 Body temperature
[List of Patents for class 702 subclass 132]  132           Subclass 132 indent level is 2 Thermal protection
[List of Patents for class 702 subclass 133]  133           Subclass 133 indent level is 2 By resistive means
[List of Patents for class 702 subclass 134]  134           Subclass 134 indent level is 2 By radiant energy
[List of Patents for class 702 subclass 135]  135           Subclass 135 indent level is 3 Infrared
[List of Patents for class 702 subclass 136]  136           Subclass 136 indent level is 2 Thermal related property
[List of Patents for class 702 subclass 137]  137           Subclass 137 indent level is 1 Density
[List of Patents for class 702 subclass 138]  138           Subclass 138 indent level is 1 Pressure
[List of Patents for class 702 subclass 139]  139           Subclass 139 indent level is 2 Exerted on or by a living body
[List of Patents for class 702 subclass 140]  140           Subclass 140 indent level is 2 Within an enclosure
[List of Patents for class 702 subclass 141]  141           Subclass 141 indent level is 1 Accelerometer
[List of Patents for class 702 subclass 142]  142           Subclass 142 indent level is 1 Speed
[List of Patents for class 702 subclass 143]  143           Subclass 143 indent level is 2 By radar or sonar
[List of Patents for class 702 subclass 144]  144           Subclass 144 indent level is 2 Of aircraft
[List of Patents for class 702 subclass 145]  145           Subclass 145 indent level is 2 Rotational speed
[List of Patents for class 702 subclass 146]  146           Subclass 146 indent level is 3 Averaging performed
[List of Patents for class 702 subclass 147]  147           Subclass 147 indent level is 3 Specific mathematical operation performed
[List of Patents for class 702 subclass 148]  148           Subclass 148 indent level is 4 For wheel speed
[List of Patents for class 702 subclass 149]  149           Subclass 149 indent level is 2 By distance and time measurement
[List of Patents for class 702 subclass 150]  150           Subclass 150 indent level is 1 Orientation or position
[List of Patents for class 702 subclass 151]  151           Subclass 151 indent level is 2 Angular position
[List of Patents for class 702 subclass 152]  152           Subclass 152 indent level is 2 3D position
[List of Patents for class 702 subclass 153]  153           Subclass 153 indent level is 3 3D orientation
[List of Patents for class 702 subclass 154]  154           Subclass 154 indent level is 2 Inclinometer
[List of Patents for class 702 subclass 155]  155           Subclass 155 indent level is 1 Dimensional determination
[List of Patents for class 702 subclass 156]  156           Subclass 156 indent level is 2 Area or volume
[List of Patents for class 702 subclass 157]  157           Subclass 157 indent level is 2 Radius or diameter
[List of Patents for class 702 subclass 158]  158           Subclass 158 indent level is 2 Linear distance or length
[List of Patents for class 702 subclass 159]  159           Subclass 159 indent level is 3 By reflected signal (e.g., ultrasonic, light, laser)
[List of Patents for class 702 subclass 160]  160           Subclass 160 indent level is 3 Pedometer
[List of Patents for class 702 subclass 161]  161           Subclass 161 indent level is 3 Electronic ruler
[List of Patents for class 702 subclass 162]  162           Subclass 162 indent level is 3 Micrometer
[List of Patents for class 702 subclass 163]  163           Subclass 163 indent level is 3 By rotary encoding means
[List of Patents for class 702 subclass 164]  164           Subclass 164 indent level is 4 Electronic tape measure
[List of Patents for class 702 subclass 165]  165           Subclass 165 indent level is 4 Odometer
[List of Patents for class 702 subclass 166]  166           Subclass 166 indent level is 2 Height or depth
[List of Patents for class 702 subclass 167]  167           Subclass 167 indent level is 2 Contouring
[List of Patents for class 702 subclass 168]  168           Subclass 168 indent level is 3 By probe (e.g., contact)
[List of Patents for class 702 subclass 169]  169           Subclass 169 indent level is 3 Center of gravity
[List of Patents for class 702 subclass 170]  170           Subclass 170 indent level is 2 Thickness or width
[List of Patents for class 702 subclass 171]  171           Subclass 171 indent level is 3 By ultrasonic
[List of Patents for class 702 subclass 172]  172           Subclass 172 indent level is 3 By radiant energy (e.g., X-ray, light)
[List of Patents for class 702 subclass 173]  173           Subclass 173 indent level is 1 Weight
[List of Patents for class 702 subclass 174]  174           Subclass 174 indent level is 2 Payload
[List of Patents for class 702 subclass 175]  175           Subclass 175 indent level is 2 Of moving article
[List of Patents for class 702 subclass 176]  176           Subclass 176 indent level is 1 Time duration or rate
[List of Patents for class 702 subclass 177]  177           Subclass 177 indent level is 2 Due time monitoring (e.g., medication clock, maintenance interval)
[List of Patents for class 702 subclass 178]  178           Subclass 178 indent level is 2 Timekeeping (e.g., clock, calendar, stopwatch)
[List of Patents for class 702 subclass 179]  179           Subclass 179 indent level is 1 Statistical measurement
[List of Patents for class 702 subclass 180]  180           Subclass 180 indent level is 2 Histogram distribution
[List of Patents for class 702 subclass 181]  181           Subclass 181 indent level is 2 Probability determination
[List of Patents for class 702 subclass 182]  182           Subclass 182 indent level is 1 Performance or efficiency evaluation
[List of Patents for class 702 subclass 183]  183           Subclass 183 indent level is 2 Diagnostic analysis
[List of Patents for class 702 subclass 184]  184           Subclass 184 indent level is 3 Maintenance
[List of Patents for class 702 subclass 185]  185           Subclass 185 indent level is 3 Cause or fault identification
[List of Patents for class 702 subclass 186]  186           Subclass 186 indent level is 2 Computer and peripheral benchmarking
[List of Patents for class 702 subclass 187]  187           Subclass 187 indent level is 1 History logging or time stamping
[List of Patents for class 702 subclass 188]  188           Subclass 188 indent level is 1 Remote supervisory monitoring
[List of Patents for class 702 subclass 189]  189           Subclass 189 indent level is 1 Measured signal processing
[List of Patents for class 702 subclass 190]  190           Subclass 190 indent level is 2 Signal extraction or separation (e.g., filtering)
[List of Patents for class 702 subclass 191]  191           Subclass 191 indent level is 3 For noise removal or suppression
[List of Patents for class 702 subclass 193]  193           Subclass 193 indent level is 4 By threshold comparison
[List of Patents for class 702 subclass 194]  194           Subclass 194 indent level is 4 By mathematical attenuation (e.g., weighting, averaging)
[List of Patents for class 702 subclass 195]  195           Subclass 195 indent level is 5 Subtracting noise component
[List of Patents for class 702 subclass 196]  196           Subclass 196 indent level is 3 Using matrix operation
[List of Patents for class 702 subclass 197]  197           Subclass 197 indent level is 4 Having multiple filtering stages
[List of Patents for class 702 subclass 198]  198           Subclass 198 indent level is 2 Measurement conversion processing (e.g., true-to-RMS value)
[List of Patents for class 702 subclass 199]  199           Subclass 199 indent level is 2 Averaging
 
FOREIGN ART COLLECTIONS
 
   FOR000          CLASS-RELATED FOREIGN DOCUMENTS
Any foreign patents or non-patent literature from subclasses that have been reclassified have been transferred directly to FOR Collections listed below. These Collections contain ONLY foreign patents or non-patent literature. The parenthetical references in the Collection titles refer to the abolished subclasses from which these Collections were derived.
              APPLICATIONS (364/400)
   FOR100          Subclass FOR100 indent level is 1 Earth sciences (e.g., weather) (364/420)
   FOR101          Subclass FOR101 indent level is 2 Seismology (364/421)
   FOR102          Subclass FOR102 indent level is 2 Well logging (364/422)
   FOR103          Subclass FOR103 indent level is 1 Electrical/electronic engineering (364/480)
   FOR104          Subclass FOR104 indent level is 2 Measuring or testing (364/481)
   FOR105          Subclass FOR105 indent level is 3 Impedance (364/482)
   FOR106          Subclass FOR106 indent level is 3 Voltage, current, or power (364/483)
   FOR107          Subclass FOR107 indent level is 3 Frequency (364/484)
   FOR108          Subclass FOR108 indent level is 4 Frequency spectrum (364/485)
   FOR109          Subclass FOR109 indent level is 3 Pulse (364/486)
   FOR110          Subclass FOR110 indent level is 3 Waveform (364/487)
              Subclass indent level is 1 Electrical/electronic engineering (364/480)
   FOR111          Subclass FOR111 indent level is 2 Power generation or distribution (364/492)
   FOR112          Subclass FOR112 indent level is 3 Economic dispatching (364/493)
   FOR113          Subclass FOR113 indent level is 3 Turbine or generator control (364/494)
   FOR114          Subclass FOR114 indent level is 3 With model (364/495)
   FOR115          Subclass FOR115 indent level is 1 Chemical and engineering sciences (364/496)
   FOR116          Subclass FOR116 indent level is 2 Chemical analysis (364/497)
   FOR117          Subclass FOR117 indent level is 3 Spectrum analysis (composition) (364/498)
   FOR118          Subclass FOR118 indent level is 3 Chemical property (364/499)
   FOR119          Subclass FOR119 indent level is 2 Chemical process control (364/500)
   FOR120          Subclass FOR120 indent level is 3 Distillation (364/501)
   FOR121          Subclass FOR121 indent level is 3 Physical mixing or separation (364/502)
   FOR122          Subclass FOR122 indent level is 3 Kilns (364/503)
   FOR123          Subclass FOR123 indent level is 2 Mechanical and civil engineering (364/505)
   FOR124          Subclass FOR124 indent level is 3 Measuring or testing (364/506)
   FOR125          Subclass FOR125 indent level is 4 Flaw or defect (364/507)
   FOR126          Subclass FOR126 indent level is 4 Stress, strain, or vibration (364/508)
   FOR127          Subclass FOR127 indent level is 4 Fluid (364/509)
   FOR128          Subclass FOR128 indent level is 5 Fluid flow (364/510)
   FOR129          Subclass FOR129 indent level is 4 Power (364/511)
   FOR130          Subclass FOR130 indent level is 1 Physics (364/524)
   FOR131          Subclass FOR131 indent level is 2 Optics or photography (364/525)
   FOR132          Subclass FOR132 indent level is 3 Color analysis (364/526)
   FOR133          Subclass FOR133 indent level is 2 Atomic or nuclear physics (364/527)
   FOR134          MEASURING, TESTING, OR MONITORING (364/550)
   FOR135          Subclass FOR135 indent level is 1 Measuring and evaluating (e.g., performance) (364/551.01)
   FOR136          Subclass FOR136 indent level is 2 Of machine tool (364/551.02)
   FOR137          Subclass FOR137 indent level is 2 Quality control determinations (364/552)
   FOR138          Subclass FOR138 indent level is 2 Transfer function evaluation (364/553)
   FOR139          Subclass FOR139 indent level is 2 Statistical data (e.g., stochastic variable) (364/554)
   FOR140          Subclass FOR140 indent level is 2 Particle count, distribution, size (364/555)
   FOR141          Subclass FOR141 indent level is 1 For basic measurements (364/556)
   FOR142          Subclass FOR142 indent level is 2 Temperature (364/557)
   FOR143          Subclass FOR143 indent level is 2 Pressure or density (364/558)
   FOR144          Subclass FOR144 indent level is 2 Orientation (364/559)
   FOR145          Subclass FOR145 indent level is 2 Dimension (364/560)
   FOR146          Subclass FOR146 indent level is 3 Distance (364/561)
   FOR147          Subclass FOR147 indent level is 4 Length or height (364/562)
   FOR148          Subclass FOR148 indent level is 4 Width or thickness (364/563)
   FOR149          Subclass FOR149 indent level is 3 Area or volume (364/564)
   FOR150          Subclass FOR150 indent level is 2 Rate of change of dimension (e.g., speed) (364/565)
   FOR151          Subclass FOR151 indent level is 2 Acceleration and further derivatives (364/566)
   FOR152          Subclass FOR152 indent level is 2 Weight (364/567)
   FOR153          Subclass FOR153 indent level is 3 Basis weight (364/568)
   FOR154          Subclass FOR154 indent level is 2 Time or time intervals (364/569)
   FOR155          Subclass FOR155 indent level is 1 Operations performed (364/570)
   FOR156          Subclass FOR156 indent level is 2 Calibration or compensation
   FOR157          Subclass FOR157 indent level is 3 Having mathematical operation on initial measurement data (364/571.02)
   FOR158          Subclass FOR158 indent level is 4 Including environmental factors (e.g., temperature) (364/571.03)
   FOR159          Subclass FOR159 indent level is 4 Including predetermined stored data (364/571.04)
   FOR160          Subclass FOR160 indent level is 4 Using difference involving initial measurement data (364/571.05)
   FOR161          Subclass FOR161 indent level is 4 Using analog calculating elements (364/571.06)
   FOR162          Subclass FOR162 indent level is 3 By table look-up (364/571.07)
   FOR163          Subclass FOR163 indent level is 3 Using operator provided data (364/571.08)
   FOR164          Subclass FOR164 indent level is 2 Filtering (364/572)
   FOR165          Subclass FOR165 indent level is 2 Linearization (364/573)
   FOR166          Subclass FOR166 indent level is 2 Noise reduction (364/574)
   FOR167          Subclass FOR167 indent level is 2 Averaging (364/575)
   FOR168          Subclass FOR168 indent level is 2 Fourier analysis (364/576)
   FOR169          Subclass FOR169 indent level is 2 Interpolation/extrapolation (364/577)
   FOR170          Subclass FOR170 indent level is 2 With control of testing or measuring apparatus (364/579)
   FOR171          Subclass FOR171 indent level is 2 Programmed testing conditions (364/580)
   FOR172          Subclass FOR172 indent level is 2 Weighting (364/581)
   FOR173          Subclass FOR173 indent level is 2 Normalization (364/582)

This file produced by USPTO - SIRA - Office of Patent Automation - Reference Tools Project

Contact: United States Patent and Trademark Office - Classification Operations Crystal Park 3, Suite 902 Washington, DC 20231 phone: (703) 305-5107

For questions and comments please e-mail.


Note: The Patent and Trademark Depository Library Program (PTDLP) administers a nationwide network of public, state and academic libraries designated as Patent and Trademark Depository Libraries authorized by 35 U.S.C. 13 to: Disseminate Patent and Trademark Information Support Diverse Intellectual Property Needs of the Public

Contact: United States Patent and Trademark Office - PTDLP Crystal Park 3, Suite 481 Washington, DC 20231 Fax: (703) 306-2662


Note: For information/comments on electronic information products, such as purchasing USPTO data, or to discuss system requirements for magnetic tape products, contact:

     Information Products Division -- U.S. Patent and Trademark Office Information Products Division
     PK3- Suite 441 Washington, DC 20231
     tel: (703) 306-2600 FAX: (703) 306-2737 email: oeip@uspto.gov

Or, browse their on-line catalog.

The Inventors Assistance Center is available to help you on patent matters.Send questions about USPTO programs and services to the USPTO Contact Center (UCC). You can suggest USPTO webpages or material you would like featured on this section by E-mail to the webmaster@uspto.gov. While we cannot promise to accommodate all requests, your suggestions will be considered and may lead to other improvements on the website.

|.HOME | INDEX| SEARCH | eBUSINESS | CONTACT US | PRIVACY STATEMENT