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100 DATA PROCESSING SYSTEM ERROR OR FAULT HANDLING
1 Reliability and availability
2 Fault recovery
3 By masking or reconfiguration
4 Of network
5 Of memory or peripheral subsystem
6 Redundant stored data accessed (e.g., duplicated data, error correction coded data, or other parity-type data)
7 Reconfiguration (e.g., adding a replacement storage component)
8 Isolating failed storage location (e.g., sector remapping)
9 Access processor affected (e.g., I/O processor, MMU, DMA processor)
10 Of processor
11 Concurrent, redundantly operating processors
12 Synchronization maintenance of processors
13 Prepared backup processor (e.g., initializing cold backup) or updating backup processor (e.g., by checkpoint message)
14 Of power supply
15 State recovery (i.e., process or data file)
16 Forward recovery (e.g., redoing committed action)
17 Reexecuting single instruction or bus cycle
18 Transmission data record (e.g., for retransmission)
19 Undo record
20 Plural recovery data sets containing set interrelation data (e.g., time values or log record numbers)
21 State validity check
22 With power supply status monitoring
23 Resetting processor
24 Safe shutdown
25 Fault locating (i.e., diagnosis or testing)
26 Artificial intelligence (e.g., diagnostic expert system)
27 Particular access structure
28 Substituted emulative component (e.g., emulator microprocessor)
29 Memory emulator feature
30 Built-in hardware for diagnosing or testing within-system component (e.g., microprocessor test mode circuit, scan path)
31 Additional processor for in-system fault locating (e.g., distributed diagnosis program)
32 Particular stimulus creation
33 Derived from analysis (e.g., of a specification or by stimulation)
34 Halt, clock, or interrupt signal (e.g., freezing, hardware breakpoint, single-stepping)
35 Substituted or added instruction (e.g., code instrumenting, breakpoint instruction)
36 Test sequence at power-up or initialization
37 Analysis (e.g., of output, state, or design)
38 Of computer software
39 Monitor recognizes sequence of events (e.g., protocol or logic state analyzer)
40 Component dependent technique
41 For reliability enhancing component (e.g., testing backup spare, or fault injection)
42 Memory or storage device component fault
43 Bus, I/O channel, or network path component fault
44 Peripheral device component fault
45 Output recording (e.g., signature or trace)
46 Operator interface for diagnosing or testing
47 Performance monitoring for fault avoidance
48 Error detection or notification
49 State error (i.e., content of instruction, data, or message)
50 State out of sequence
51 Control flow state sequence monitored (e.g., watchdog processor for control-flow checking)
52 Error checking code
53 Address error
54 Storage content error
55 Timing error (e.g., watchdog timer time-out)
56 Bus or I/O channel device fault
57 Error forwarding and presentation (e.g., operator console, error display)
699 PULSE OR DATA ERROR HANDLING
700 Skew detection correction
701 Data formatting to improve error detection correction capability
702 Memory access (e.g., address permutation)
703 Testing of error-check system
704 Error count or rate
705 Pseudo-error rate
706 Up-down counter
707 Synchronization control
708 Shutdown or establishing system parameter (e.g., transmission rate)
709 Data pulse evaluation/bit decision
710 Replacement of memory spare location, portion, or segment
711 Spare row or column
712 Transmission facility testing
713 For channel having repeater
714 By tone signal
715 Test pattern with comparison
717 Loop or ring configuration
718 Memory testing
719 Read-in with read-out and compare
720 Special test pattern (e.g., checkerboard, walking ones)
721 Electrical parameter (e.g., threshold voltage)
722 Performing arithmetic function on memory contents
723 Error mapping or logging
724 Digital logic testing
725 Programmable logic array (PLA) testing
726 Scan path testing (e.g., level sensitive scan design (LSSD))
727 Boundary scan
728 Random pattern generation (includes pseudorandom pattern)
729 Plural scan paths
731 Clock or synchronization
732 Signature analysis
733 Built-in testing circuit (BILBO)
734 Structural (in-circuit test)
735 Device response compared to input pattern
736 Device response compared to expected fault-free response
737 Device response compared to fault dictionary/truth table
738 Including test pattern generator
739 Random pattern generation (includes pseudorandom pattern)
740 Having analog signal
742 Testing specific device
744 Clock or synchronization
745 Determination of marginal operation limits
746 Digital data error correction
747 Substitution of previous valid data
748 Request for retransmission
749 Retransmission if no ACK returned
750 Feedback to transmitter for comparison
751 Including forward error correction capability
752 Forward correction by block code
753 Double error correcting with single error correcting code
754 Error correction during refresh cycle
755 Double encoding codes (e.g., product, concatenated)
756 Cross-interleave Reed-Solomon code (CIRC)
757 Parallel generation of check bits
758 Error correcting code with additional error detection code (e.g., cyclic redundancy character, parity)
759 Look-up table encoding or decoding
760 Threshold decoding (e.g., majority logic)
761 Random and burst error correction
762 Burst error correction
763 Memory access
764 Error correct and restore
765 Error pointer
766 Check bits stored in separate area of memory
767 Code word for plural n-bit (n>1) storage units (e.g., x4 DRAM's)
768 Error correction code for memory address
769 Dynamic data storage
772 Code word parallel access
773 Solid state memory
774 Adaptive error-correcting capability
775 Synchronization
776 For packet or frame multiplexed data
777 Hamming code
778 Nonbinary data (e.g., ternary)
779 Variable length data
780 Using symbol reliability information (e.g., soft decision)
781 Code based on generator polynomial
782 Bose-Chaudhuri-Hocquenghem code
784 Reed-Solomon code
785 Syndrome computed
786 Forward error correction by tree code (e.g., convolutional)
787 Random and burst errors
788 Burst error
789 Synchronization
791 Sequential decoder (e.g., Fano or stack algorithm)
792 Trellis code
793 Syndrome decodable (e.g., self orthogonal)
794 Maximum likelihood
795 Viterbi decoding
796 Branch metric calculation
797 Majority decision/voter circuit
798 Error detection for synchronization control
799 Error/fault detection technique
801 Parity generator or checker circuit detail
802 Even and odd parity
803 Parity prediction
804 Plural dimension parity check
805 Storage accessing (e.g., address parity check)
806 Constant-ratio code (m/n)
807 Check character
808 Modulo-n residue check character
809 Code constraint monitored
810 Multilevel coding (n>2)
811 Forbidden combination or improper condition
812 Specified digital signal or pulse count
813 Two key-down detector
814 Data timing/clocking
815 Time delay/interval monitored
816 Two-rail logic
817 Noise level
818 Missing-bit/drop-out detection
819 Comparison of data
820 Plural parallel devices of channels
821 Transmission facility
822 Sequential repetition
823 True and complement data
824 Device output compared to input
FOR000 CLASS-RELATED FOREIGN DOCUMENTS
Any foreign patents or non-patent literature from subclasses that have been reclassified have been transferred directly to FOR Collections listed below. These Collections contain ONLY foreign patents or non-patent literature. The parenthetical references in the Collection titles refer to the abolished subclasses from which these Collections were derived.
MEMORY TESTING (371/21.1)
DIGITAL LOGIC TESTING (371/22.1)
DIGITAL DATA ERROR CORRECTION (371/30)
FOR100 Scan path testing (LSSD) (371/22.3)
FOR101 Including test pattern generator (371/27)
FOR103 Memory access (371/40.1)
FOR104 Convolutional code (371/43)
FOR288 ERROR/FAULT ANTICIPATION (371/4)
Replacement with spare device or system (371/8.1)
FOR289 Transmission facility or channel (371.8.2)
FOR291 Transmission facility (371/11.2)
FOR292 Data processor or computer (371/11.3)
DIAGNOSTIC TESTING (371/15.1)
FOR293 Programmable processor testing (371/16.1)
FOR294 Emulator device (371/16.2)
FOR295 Watchdog timer (e.g., time-out) (371/16.3)
FOR296 Processor within diverse (microwave, photocopier) (371/16.4)
FOR297 Error or fault, logging or tracking (371/16.5)
FOR298 Dedicated maintenance subsystem (371/18)
FOR299 Testing of external device by programmable digital computer (371/20)
FOR300 ERROR DETECTION FOR SYNCHRONIZATION CONTROL (371/47.1)
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